Comparing different solutions for testing resistive defects in low-power SRAMs. - Nunzio Mirabella; Michelangelo Grosso; Giovanna Franchino; Salvatore Rinaudo; Ioannis Deretzis; Antonino La Magna; Matteo Sonza Reorda (LATS, 2021)

Machine Learning-based feasibility estimation of digital blocks in BCD technology. - Francesco Daghero; Gabriele Faraone; Michelangelo Grosso; Daniele Jahier Pagliari; Nicola Di Carolo; Giovanna Antonella Franchino; Dario Licastro; Eugenio Serianni (DTTIS, 2024)

Predicting Digital Layout Success in Analog-on-Top Designs Using Machine Learning. - Francesco Daghero; Gabriele Faraone; Eugenio Serianni; Nicola Di Carolo; Dario Licastro; Giovanna Antonella Franchino; Michelangelo Grosso; Daniele Jahier Pagliari (NewCAS, 2025)