An automated lifetest equipment for optical emitters. - M. Giglio; G. Martines; Giovanna Mura; Simona Podda; Massimo Vanzi (Microelectron. Reliab., 2002)

Backside Failure Analysis of GaAs ICs after ESD tests. - Gaudenzio Meneghesso; A. Cocco; Giovanna Mura; Simona Podda; Massimo Vanzi (Microelectron. Reliab., 2002)

ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology. - Luca Sponton; Lorenzo Cerati; Giuseppe Croce; Giovanna Mura; Simona Podda; Massimo Vanzi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2002)

Reliability of visible GaN LEDs in plastic package. - Gaudenzio Meneghesso; S. Levada; Enrico Zanoni; Gaetano Scamarcio; Giovanna Mura; Simona Podda; Massimo Vanzi; S. Du; I. Eliashevich (Microelectron. Reliab., 2003)

On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. - Giovanna Mura; Massimo Vanzi; Maria Stangoni; Mauro Ciappa; Wolfgang Fichtner (Microelectron. Reliab., 2003)

Failure analysis of RFIC amplifiers. - Giovanna Mura; Massimo Vanzi; G. Micheletti (Microelectron. Reliab., 2004)

Reliability predictions in electronic industrial applications. - G. Cassanelli; Giovanna Mura; F. Cesaretti; Massimo Vanzi; Fausto Fantini (Microelectron. Reliab., 2005)

Failure Analysis-assisted FMEA. - G. Cassanelli; Giovanna Mura; Fausto Fantini; Massimo Vanzi; Bernard Plano (Microelectron. Reliab., 2006)

High temperature electro-optical degradation of InGaN/GaN HBLEDs. - Matteo Meneghini; Lorenzo Trevisanello; C. Sanna; Giovanna Mura; Massimo Vanzi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2007)

Sulfur-contamination of high power white LED. - Giovanna Mura; G. Cassanelli; Fausto Fantini; Massimo Vanzi (Microelectron. Reliab., 2008)

Lot reliability issues in commercial off the shelf (COTS) microelectronic devices. - Giovanna Mura; Massimo Vanzi (Microelectron. Reliab., 2009)

The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis. - Giovanna Mura; Massimo Vanzi (Microelectron. Reliab., 2010)

DC parameters for laser diodes from experimental curves. - Massimo Vanzi; Giovanna Mura; G. Martines (Microelectron. Reliab., 2011)

Phosphors for LED-based light sources: Thermal properties and reliability issues. - Matteo Dal Lago; Matteo Meneghini; Nicola Trivellin; Giovanna Mura; Massimo Vanzi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2012)

MIM capacitor-related early-stage field failures. - Jia Lu; BoCheng Cao; WenShe Wu; YuFeng Dai; ChuangJun Huang; Giovanna Mura (Microelectron. Reliab., 2012)

Chip and package-related degradation of high power white LEDs. - Matteo Meneghini; Matteo Dal Lago; Nicola Trivellin; Giovanna Mura; Massimo Vanzi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2012)

Thermal and electrical investigation of the reverse bias degradation of silicon solar cells. - Alessandro Compagnin; Matteo Meneghini; Marco Barbato; Valentina Giliberto; Andrea Cester; Massimo Vanzi; Giovanna Mura; Enrico Zanoni; Gaudenzio Meneghesso (Microelectron. Reliab., 2013)

"Hot-plugging" of LED modules: Electrical characterization and device degradation. - Matteo Dal Lago; Matteo Meneghini; Nicola Trivellin; Giovanna Mura; Massimo Vanzi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2013)

The role of the optical trans-characteristics in laser diode analysis. - Giovanna Mura; Massimo Vanzi; Giulia Marcello; Robert Cao (Microelectron. Reliab., 2013)

Optical losses in single-mode laser diodes. - Massimo Vanzi; Giovanna Mura; M. Marongiu; T. Tomasi (Microelectron. Reliab., 2013)

FIB-induced electro-optical alterations in a DFB InP laser diode. - Giovanna Mura; Massimo Vanzi; Giulia Marcello (Microelectron. Reliab., 2014)

Stress-induced instabilities of shunt paths in high efficiency MWT solar cells. - Marco Barbato; Matteo Meneghini; Andrea Cester; Alessandro Barbato; Enrico Zanoni; Gaudenzio Meneghesso; Giovanna Mura; Diego Tonini; A. Voltan; Giorgio Cellere (IRPS, 2015)

Clamp voltage and ideality factor in laser diodes. - Massimo Vanzi; Giovanna Mura; Giulia Marcello; G. Martines (Microelectron. Reliab., 2015)

Single Event Transient acquisition and mapping for space device Characterization. - Roberta Pilia; Guillaume Bascoul; Kevin Sanchez; Giovanna Mura; Fulvio Infante (Microelectron. Reliab., 2016)

ESD tests on 850 nm GaAs-based VCSELs. - Massimo Vanzi; Giovanna Mura; Giulia Marcello; Kunhui Xiao (Microelectron. Reliab., 2016)

Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities. - Riccardo Enrici Vaion; Matteo Medda; Alberto Mancaleoni; Giovanna Mura; A. Pintus; M. De Tomasi (Microelectron. Reliab., 2017)

Practical optical gain by an extended Hakki-Paoli method. - Massimo Vanzi; Giulia Marcello; Giovanna Mura; G. Le Galès; S. Joly; Yannick Deshayes; Laurent Béchou (Microelectron. Reliab., 2017)

Reliability concerns from the gray market. - Giovanna Mura (Microelectron. Reliab., 2018)

Further improvements of an extended Hakki-Paoli method. - Massimo Vanzi; Giovanna Mura; G. Martines (Microelectron. Reliab., 2018)

A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films. - Giorgio Montisci; Giovanna Mura; Giacomo Muntoni; Giovanni Andrea Casula; Francesco Paolo Chietera; Mahmoud Aburish-Hmidat (IEEE Access, 2023)