Cycling-induced threshold-voltage instabilities in nanoscale NAND flash memories: Sensitivity to the array background pattern. - Giovanni M. Paolucci; Massimo Ernesto Bertuccio; Christian Monzio Compagnoni; Silvia Beltrami; Alessandro S. Spinelli; Andrea L. Lacaita; Angelo Visconti (ESSDERC, 2014)

Cycling pattern and read/bake conditions dependence of random telegraph noise in decananometer NAND flash arrays. - Carmine Miccoli; Giovanni M. Paolucci; Christian Monzio Compagnoni; Alessandro S. Spinelli; Akira Goda (IRPS, 2015)

Impact of few-electron phenomena on the operation and reliability of nanoscale Flash memories. - Giovanni M. Paolucci (2015)