Reliability and wearout characterisation of LEDs. - Peter Jacob; Albert Kunz; Giovanni Nicoletti (Microelectron. Reliab., 2006)

Device decapsulated (and/or depassivated) - Retest ok - What happened? - Peter Jacob; Giovanni Nicoletti; Florian Hauf (Microelectron. Reliab., 2007)

Reading distance degradation mechanisms of near-field RFID devices. - Peter Jacob; Willy Knecht; Albert Kunz; Giovanni Nicoletti; Thomas Lautenschlager; Moreno Mondada; Damien Pachoud (Microelectron. Reliab., 2009)

Failure causes generating aluminium protrusion/extrusion. - Peter Jacob; Giovanni Nicoletti (Microelectron. Reliab., 2013)