Gate-lag effects in AlGaAs/GaAs power HFET's. - Mattia Borgarino; Giovanna Sozzi; Andrea Mazzanti; Giovanni Verzellesi (Microelectron. Reliab., 2001)

DC-to-RF dispersion effects in GaAs- and GaN-based heterostructure FETs: performance and reliability issues. - Giovanni Verzellesi; Gaudenzio Meneghesso; Alessandro Chini; Enrico Zanoni; Claudio Canali (Microelectron. Reliab., 2005)

Characterization and analysis of trap-related effects in AlGaN-GaN HEMTs. - Mustapha Faqir; Giovanni Verzellesi; Fausto Fantini; Francesca Danesin; Fabiana Rampazzo; Gaudenzio Meneghesso; Enrico Zanoni; Anna Cavallini; Antonio Castaldini; Nathalie Labat; André Touboul; Christian Dua (Microelectron. Reliab., 2007)

Analysis of current collapse effect in AlGaN/GaN HEMT: Experiments and numerical simulations. - Mustapha Faqir; Mohsine Bouya; Nathalie Malbert; Nathalie Labat; D. Carisetti; Benoit Lambert; Giovanni Verzellesi; Fausto Fantini (Microelectron. Reliab., 2010)

Breakdown investigation in GaN-based MIS-HEMT devices. - Fabio Alessio Marino; Davide Bisi; Matteo Meneghini; Giovanni Verzellesi; Enrico Zanoni; Marleen Van Hove; Shuzhen You; Stefaan Decoutere; Denis Marcon; Steve Stoffels; Nicolo Ronchi; Gaudenzio Meneghesso (ESSDERC, 2014)

ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements. - Matteo Meneghini; Simone Vaccari; Matteo Dal Lago; Stefano Marconi; Marco Barbato; Nicola Trivellin; Alessio Griffoni; Alberto Alfier; Giovanni Verzellesi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2014)

A Wireless Personal Sensor Node for Real Time Dosimetry of Interventional Radiology Operators. - Daniel Magalotti; Pisana Placidi; Stefania Fabiani; Lucia Bissi; Massimiliano Paolucci; Andrea Scorzoni; Andrea Calandra; Giovanni Verzellesi; Leonello Servoli (ApplePies, 2015)

Modeling challenges for high-efficiency visible light-emitting diodes. - Francesco Bertazzi; Stefano Dominici; Marco Mandurrino; Dipika Robidas; Xiangyu Zhou; Marco Vallone; Marco Calciati; Pierluigi Debernardi; Giovanni Verzellesi; Matteo Meneghini; Enrico Bellotti; Giovanni Ghione; et al. (RTSI, 2015)

Variability and sensitivity to process parameters variations in InGaAs dual-gate ultra-thin body MOSFETs: A scaling perspective. - Nicolo Zagni; Francesco Maria Puglisi; Giovanni Verzellesi; Paolo Pavan (PATMOS, 2017)

Characterization of a premixed flat combustor through plasma current measurements. - Luca Pintori; Giovanni Verzellesi; Luigi Rovati (I2MTC, 2020)

Trap Dynamics Model Explaining the RON Stress/Recovery Behavior in Carbon-Doped Power AlGaN/GaN MOS-HEMTs. - Nicolò Zagni; Alessandro Chini; Francesco Maria Puglisi; Paolo Pavan; Matteo Meneghini; Gaudenzio Meneghesso; Enrico Zanoni; Giovanni Verzellesi (IRPS, 2020)

Investigation on VTH and RON Slow/Fast Drifts in SiC MOSFETs. - Marcello Cioni; Alessandro Bertacchini; Alessandro Mucci; Giovanni Verzellesi; Paolo Pavan; Alessandro Chini (IRPS, 2021)