A New Effective Methodology for Semiconductor Power Devices HTRB Testing. - Calogero Pace; Jorge Hernandez-Ambato; Letizia Fragomeni; Giuseppe Consentino; Alessandro D'Ignoti; Salvatore Galiano; Antonio Grimaldi (IEEE Trans. Ind. Electron., 2017)

Characterization and Modeling of BTI in SiC MOSFETs. - Davide Cornigli; Andrea Natale Tallarico; Susanna Reggiani; Claudio Fiegna; Enrico Sangiorgi; Luis Sanchez; Carlos Valdivieso; Giuseppe Consentino; Felice Crupi (ESSDERC, 2019)