ESD protection structures for BCD5 smart power technologies. - Luca Sponton; Lorenzo Cerati; Giuseppe Croce; Francesco Chrappan; Claudio Contiero; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2001)

ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology. - Luca Sponton; Lorenzo Cerati; Giuseppe Croce; Giovanna Mura; Simona Podda; Massimo Vanzi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2002)

Optimization of ESD protection structures suitable for BCD6 smart power technology. - Gaudenzio Meneghesso; N. Novembre; Enrico Zanoni; Luca Sponton; Lorenzo Cerati; Giuseppe Croce (Microelectron. Reliab., 2003)

Investigation of the hot carrier degradation in power LDMOS transistors with customized thick oxide. - Andrea Natale Tallarico; Susanna Reggiani; Paolo Magnone; Giuseppe Croce; Riccardo Depetro; P. Gattari; Enrico Sangiorgi; Claudio Fiegna (Microelectron. Reliab., 2017)

TCAD investigation on hot-electron injection in new-generation technologies. - Susanna Reggiani; Mattia Rossetti; Antonio Gnudi; Andrea Natale Tallarico; Antonio Molfese; Stefano Manzini; Riccardo Depetro; Giuseppe Croce; Enrico Sangiorgi; Claudio Fiegna (Microelectron. Reliab., 2018)

TCAD predictions of hot-electron injection in p-type LDMOS transistors. - Federico Giuliano; Riccardo Depetro; Giuseppe Croce; Andrea Natale Tallarico; Susanna Reggiani; Antonio Gnudi; Enrico Sangiorgi; Claudio Fiegna; Mattia Rossetti; Antonio Molfese; Stefano Manzini (ESSDERC, 2019)

Full Understanding of Hot Electrons and Hot/Cold Holes in the Degradation of p-channel Power LDMOS Transistors. - Andrea Natale Tallarico; Susanna Reggiani; Riccardo Depetro; Giuseppe Croce; Enrico Sangiorgi; Claudio Fiegna (IRPS, 2020)

Non Volatile Memory in Advanced Smart Power technology: product requirements and integration solutions. - Giuseppe Croce (IMW, 2022)