Channel hot carrier effects in n-MOSFET devices of advanced submicron CMOS technologies. - Giuseppe La Rosa; Stewart E. Rauch III (Microelectron. Reliab., 2007)

Impact of 3D copper TSV integration on 32SOI FEOL and BEOL reliability. - Mukta G. Farooq; Giuseppe La Rosa; Fen Chen; Prakash Periasamy; Troy L. Graves-abe; Chandrasekharan Kothandaraman; C. Collins; W. Landers; J. Oakley; J. Liu; John Safran; S. Ghosh; et al. (IRPS, 2015)

Oxygen vacancy traps in Hi-K/Metal gate technologies and their potential for embedded memory applications. - Chandrasekharan Kothandaraman; X. Chen; Dan Moy; Dallas Lea; Sami Rosenblatt; Faraz Khan; Derek Leu; Toshiaki Kirihata; D. Ioannou; Giuseppe La Rosa; Jeffrey B. Johnson; Norman Robson; et al. (IRPS, 2015)

Estimating transistor channel temperature using time-resolved and time-integrated NIR emission. - Franco Stellari; Alan J. Weger; Keith A. Jenkins; Giuseppe La Rosa; Barry P. Linder; Peilin Song (IRPS, 2018)

Process technology for IBM 14-nm processor designs featuring silicon-on-insulator FinFETs. - Scott R. Stiffler; Ravikumar Ramachandran; W. Kirklen Henson; Noah Zamdmer; Kevin McStay; Giuseppe La Rosa; Kevin M. Boyd; Sungjae Lee; Claude Ortolland; Paul C. Parries (IBM J. Res. Dev., 2018)

Long Term NBTI Relaxation Under AC and DC Biased Stress and Recovery. - Elnatan Mataev; James H. Stathis; Giuseppe La Rosa; Barry P. Linder (IRPS, 2019)

Effectiveness of Computer-based e-Learning and Virtual Reality Training System for the Preparatory Phase of a Training on Maintenance Procedure. - Filippo Gabriele Pratticò; Debora Di Cosmo; Matteo Piviotti; Giuseppe La Rosa; Fabrizio Lamberti (ICCE, 2024)