Sample Preparation methodology for ultra thin oxide damage in Metal-Insulator-Metal capacitors. - Giancarlo Calvagno; Giuseppe Muni; Andrea Jossa; Domenico Mello (Microelectron. Reliab., 2012)

Fault isolation in a case study of failure analysis on Metal-Insulator-Metal capacitor structures. - V. Giuffrida; P. Barbarino; Giuseppe Muni; Giancarlo Calvagno; G. Latteo; Domenico Mello (Microelectron. Reliab., 2015)