Crested barrier in the tunnel stack of non-volatile memories. - Fernanda Irrera; Giuseppina Puzzilli (Microelectron. Reliab., 2005)

A comprehensive model for oxide degradation. - Fernanda Irrera; Giuseppina Puzzilli; Domenico Caputo (Microelectron. Reliab., 2005)

Characterization of charge trapping in SiO2/Al2O3 dielectric stacks by pulsed C-V technique. - Giuseppina Puzzilli; Bogdan Govoreanu; Fernanda Irrera; Maarten Rosmeulen; Jan Van Houdt (Microelectron. Reliab., 2007)

Reliability improvements in 50 nm MLC NAND flash memory using short voltage programming pulses. - Fernanda Irrera; Ivan Piccoli; Giuseppina Puzzilli; Massimo Rossini; Tommaso Vali (Microelectron. Reliab., 2009)