Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. - Francesco Angione; Davide Appello; J. Aribido; Jyotika Athavale; Nicolò Bellarmino; Paolo Bernardi; Riccardo Cantoro; Corrado De Sio; Tommaso Foscale; Gabriele Gavarini; J. Guerrero; Martin Huch; et al. (ETS, 2022)

A novel SEU injection setup for Automotive SoC. - Giusy Iaria; Tommaso Foscale; Paolo Bernardi; Luca Presicce; Matteo Sonza Reorda; Davide Appello; Vincenzo Tancorre; Roberto Ugioli (ISIE, 2022)

In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip. - Gabriele Filipponi; Giusy Iaria; Matteo Sonza Reorda; Davide Appello; Giuseppe Garozzo; Vincenzo Tancorre (ITC, 2022)

A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. - Giusy Iaria; Francesco Angione; Paolo Bernardi; Matteo Sonza Reorda; Davide Appello; Giuseppe Garozzo; Vincenzo Tancorre (LATS, 2022)

About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics. - Paolo Bernardi; Lorenzo Cardone; Giusy Iaria; Davide Appello; Giuseppe Garozzo; Vincenzo Tancorre (IOLTS, 2023)

Enhancing Logic Diagnosis of Field Returns Through Logic BIST in Automotive SoCs. - Paolo Bernardi; Gabriele Filipponi; Giusy Iaria; Claudia Bertani; Vincenzo Tancorre (LATS, 2025)

A Comprehensive Scan Test Cost Model to Optimize the Production of Very Large SoCs. - Giusy Iaria; Paolo Bernardi; Claudia Bertani; Lorenzo Cardone; Giuseppe Garozzo; Vincenzo Tancorre (IEEE Trans. Computers, 2025)

Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC. - Francesco Angione; Paolo Bernardi; Giusy Iaria; Claudia Bertani; Vincenzo Tancorre (IEEE Trans. Computers, 2025)