Which paradigm can improve the reliability of next-generation measurement system software. - Satoshi Imai; Takahiro Yamaguchi; Givargis A. Danialy (OOPSLA Addendum, 1992)

Bridging the gap between embedded test and ATE. - Martin Bell; Givargis Danialy 001; Michael C. Howells; Stephen Pateras (ITC, 2000)

Contactless digital testing of IC pin leakage currents. - Stephen K. Sunter; Charles McDonald; Givargis Danialy 001 (ITC, 2001)

IJTAG Through a Two-Pin Chip Interface. - Manu Baby; Bernd Büttner; Piet Engelke; Ulrike Pfannkuchen; Reinhard Meier; Jonathan Gaudet; Jean-François Côté; Givargis Danialy 001; Martin Keim; Lori Schramm (ITC, 2020)

Affordable and Comprehensive Testing of 3-D Stacked Die Devices. - Jean-François Côté; Jeff Fan; Sean Shen; Givargis Danialy 001; Marcin Lipinski; Michael Garbers; Wu Yang; Martin Keim; Andreas Glowatz; Joe Reynick; Ayush Patel; Joanna Michna (IEEE Des. Test, 2022)