HITEST : Intelligent Test Generation. - Gordon D. Robinson (ITC, 1983)

Artificial Intelligence and Testing. - Gordon D. Robinson (ITC, 1984)

Interconnect testing of boards with partial boundary scan. - Gordon D. Robinson; John G. Deshayes (ITC, 1990)

Scan test architectures for digital board testers. - Matthew L. Fichtenbaum; Gordon D. Robinson (J. Electron. Test., 1991)

Design and Test - The Next Problems. - Gordon D. Robinson (ICCD, 1992)

NAND Trees Accurately Diagnose Board-Level Pin Faults. - Gordon D. Robinson (ITC, 1994)

DFT, test lifecycles and the product lifecycle. - Gordon D. Robinson (ITC, 1999)

Board Test: Wanted Dead or Alive. - Gordon D. Robinson (ITC, 2002)

Open Architecture ATE: Dream or Reality? - Gordon D. Robinson (ITC, 2004)

Board and system test with SoC DFT. - Gordon D. Robinson (ITC, 2005)