A Decision Tree-Based Screening Method for Improving Test Quality of Memory Chips. - Ya-Chi Cheng; Pai-Yu Tan; Cheng-Wen Wu; Ming-Der Shieh; Chien-Hui Chuang; Gordon Liao (ITC-Asia, 2022)

Weak Die Screening by Feature Prioritized Random Forest for Improving Semiconductor Quality and Reliability. - Shian-Yu Lin; Pai-Yu Tan; Cheng-Wen Wu; Ming-Der Shieh; Chien-Hui Chuang; Gordon Liao (ITC-Asia, 2022)

Improving Test Quality of Memory Chips by a Decision Tree-Based Screening Method. - Ya-Chi Cheng; Pai-Yu Tan; Cheng-Wen Wu; Ming-Der Shieh; Chien-Hui Chuang; Gordon Liao (ITC, 2022)

A Memory Built-In Peer-Repair Architecture for Mesh-Connected Processor Array. - Pai-Yu Tan; Chih-Hsuan Tung; Cheng-Wen Wu; Mincent Lee; Gordon Liao (VLSI-DAT, 2022)