On-Chip Structures for Timing Measurements and Test. - D. J. Kinniment; Oleh V. Maevsky; Gordon Russell 002; Alexandre Yakovlev; Alexandre V. Bystrov (ASYNC, 2002)

On-chip structures for timing measurement and test. - D. J. Kinniment; Oleh V. Maevsky; Alexandre V. Bystrov; Gordon Russell 002; Alexandre Yakovlev (Microprocess. Microsystems, 2003)

Design of Sub-10-Picoseconds On-Chip Time Measurement Circuit. - M. Amir Abas; Gordon Russell 002; D. J. Kinniment (DATE, 2004)

Measuring Deep Metastability. - David Kinniment; Keith Heron; Gordon Russell 002 (ASYNC, 2006)

A Robust Synchronizer. - Jun Zhou 017; David Kinniment; Gordon Russell 002; Alexandre Yakovlev (ISVLSI, 2006)

A High Resolution Flash Time-to-Digital Converter Taking Into Account Process Variability. - Nikolaos Minas; David Kinniment; Keith Heron; Gordon Russell 002 (ASYNC, 2007)

A Low Power Information Redundant Concurrent Error Detecting Asynchronous Processor. - Matthew Marshall; Gordon Russell 002 (DSD, 2007)

Embedded high-resolution delay measurement system using time amplification. - M. Amir Abas; Gordon Russell 002; David Kinniment (IET Comput. Digit. Tech., 2007)

Built-in time measurement circuits - a comparative design study. - M. Amir Abas; Gordon Russell 002; David Kinniment (IET Comput. Digit. Tech., 2007)

Measuring Deep Metastability and Its Effect on Synchronizer Performance. - David Kinniment; Charles E. Dike; Keith Heron; Gordon Russell 002; Alexandre Yakovlev (IEEE Trans. Very Large Scale Integr. Syst., 2007)

FPGA Implementation of an Asynchronous Processor with Both Online and Offline Testing Capabilities. - Nikolaos Minas; Matthew Marshall; Gordon Russell 002; Alex Yakovlev (ASYNC, 2008)

Adapting Synchronizers to the Effects of on Chip Variability. - Jun Zhou 017; David Kinniment; Gordon Russell 002; Alex Yakovlev (ASYNC, 2008)

High resolution flash time-to-digital converter with sub-picosecond measurement capabilities. - Nikolaos Minas; David Kinniment; Gordon Russell 002; Alex Yakovlev (SoC, 2008)

The impact of variability on the reliability of long on-chip interconnect in the presence of crosstalk. - Basel Halak; Santosh Shedabale; Hiran Ramakrishnan; Alexandre Yakovlev; Gordon Russell 002 (SLIP, 2008)

Statistical modelling of the variation in advanced process technologies using a multi-level partitioned response. - Santosh Shedabale; Hiran Ramakrishnan; Gordon Russell 002; Alexandre Yakovlev; Sanatan Chattopadhyay (IET Circuits Devices Syst., 2008)

On-Chip Measurement of Deep Metastability in Synchronizers. - Jun Zhou 017; David Kinniment; Charles E. Dike; Gordon Russell 002; Alexandre Yakovlev (IEEE J. Solid State Circuits, 2008)

Extending Synchronization from Super-Threshold to Sub-threshold Region. - Jun Zhou 017; Maryam Ashouei; David Kinniment; Jos Huisken; Gordon Russell 002 (ASYNC, 2010)

M-PRES: a statistical tool for modelling the impact of manufacturing process variations on circuit-level performance parameters. - Santosh Shedabale; Gordon Russell 002; Alexandre Yakovlev (IET Circuits Devices Syst., 2011)

Design and analysis of a low-swing driver scheme for long interconnects. - Nor Muzlifah Mahyuddin; Gordon Russell 002; E. Graeme Chester (Microelectron. J., 2011)

Sub-threshold synchronizer. - Jun Zhou 017; Maryam Ashouei; David Kinniment; Jos Huisken; Gordon Russell 002; Alexandre Yakovlev (Microelectron. J., 2011)

Reconfigurable time interval measurement circuit incorporating a programmable gain time difference amplifier. - Ahmed Naif M. Alahmadi; Gordon Russell 002; Alex Yakovlev (DDECS, 2012)

VARMA - VARiability modelling and analysis tool. - Gordon Russell 002; Frank P. Burns; Alex Yakovlev (DDECS, 2012)

Statistical delay modelling of manufacturing process variations at system level. - Chenxi Ni; Gordon Russell 002; Alex Bystrov (NEWCAS, 2012)

Modelling and Analysis of Manufacturing Variability Effects from Process to Architectural Level. - Chenxi Ni; Ziyad Al Tarawneh; Gordon Russell 002; Alexandre V. Bystrov (PATMOS, 2012)