A Parametric DFT Scheme for STT-MRAMs. - Govind Radhakrishnan; Youngki Yoon; Manoj Sachdev (IEEE Trans. Very Large Scale Integr. Syst., 2019)

Accelerating STT-MRAM Ramp-up Characterization. - Govind Radhakrishnan; Youngki Yoon; Manoj Sachdev (NEWCAS, 2020)

Monitoring Aging Defects in STT-MRAMs. - Govind Radhakrishnan; Youngki Yoon; Manoj Sachdev (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020)