Dynamic voltage (IR) drop analysis and design closure: Issues and challenges. - S. K. Nithin; Gowrysankar Shanmugam; Sreeram Chandrasekar (ISQED, 2010)

DFM aware bridge pair extraction for manufacturing test development. - Sarveswara Tammali; Vishal Khatri; Gowrysankar Shanmugam; Mark Terry (ITC, 2010)