A Methodology for Testing Content Addressable Memories. - Grady Giles; Craig Hunter (ITC, 1985)

Testability Features of the MC68851 PMMU. - Grady Giles; Kenneth Scheuer (ITC, 1986)

Testability considerations in the design of the MC68340 Integrated Processor Unit. - Philip E. Bishop; Grady Giles; Sudarshan Iyengar; C. Thomas Glover; Wai-On Law (ITC, 1990)

Implementing 1149.1 on CMOS Microprocessors. - William C. Bruce; Michael G. Gallup; Grady Giles; Tom Munns (ITC, 1991)

Case study of 1149.01 microprocessor implementations. - William C. Bruce; Michael G. Gallup; Grady Giles; Tom Munns (Microprocess. Microsystems, 1993)

A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors. - Michael Mateja; Alfred L. Crouch; Renny Eisele; Grady Giles; Dale Amason (ITC, 1997)

Test Development for Second-Generation ColdFire Microprocessors. - Dale Amason; Alfred L. Crouch; Renny Eisele; Grady Giles; Michael Mateja (IEEE Des. Test Comput., 1998)

Conversion of small functional test sets of nonscan blocks to scan patterns. - Don E. Ross; Tim Wood 001; Grady Giles (ITC, 2000)

Is Scan (Alone) Sufficient to Test Today?s Microprocessors? Not Quite, but We Can?t Get the Job Done Without It. - Grady Giles (ITC, 2002)

Built-in constraint resolution. - Grady Giles; Joel Irby; Daniela Toneva; Kun-Han Tsai (ITC, 2005)

Test Access Mechanism for Multiple Identical Cores. - Grady Giles; Jing Wang; Anuja Sehgal; Kedarnath J. Balakrishnan; James Wingfield (ITC, 2008)

The Test Features of the Quad-Core AMD Opteron- Microprocessor. - Tim Wood 001; Grady Giles; Chris Kiszely; Martin Schuessler; Daniela Toneva; Joel Irby; Michael Mateja (ITC, 2008)

Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor. - Kedarnath J. Balakrishnan; Grady Giles; James Wingfield (IEEE Des. Test Comput., 2009)

The scan-DFT features of AMD's next-generation microprocessor core. - Mahmut Yilmaz; Baosheng Wang; Jayalakshmi Rajaraman; Tom Olsen; Kanwaldeep Sobti; Dwight Elvey; Jeff Fitzgerald; Grady Giles; Wei-Yu Chen (ITC, 2010)

EDT bandwidth management - Practical scenarios for large SoC designs. - Jakub Janicki; Jerzy Tyszer; Wu-Tung Cheng; Yu Huang 005; Mark Kassab; Nilanjan Mukherjee 001; Janusz Rajski; Yan Dong; Grady Giles (ITC, 2013)

Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures. - Wu-Tung Cheng; Yan Dong; Grady Giles; Yu Huang 005; Jakub Janicki; Mark Kassab; Grzegorz Mrugalski; Nilanjan Mukherjee 001; Janusz Rajski; Jerzy Tyszer (IEEE Trans. Very Large Scale Integr. Syst., 2015)

Toward more efficient scan data bandwidth utilization on modern SOCs. - Yan Dong; Grady Giles; GuoLiang Li; Jeff Rearick; John Schulze; James Wingfield; Tim Wood 001 (SoCC, 2016)

Maximizing scan pin and bandwidth utilization with a scan routing fabric. - Yan Dong; Grady Giles; GuoLiang Li; Jeff Rearick; John Schulze; James Wingfield; Tim Wood 001 (ITC, 2017)