High-Level Synthesis: Technology Transfer to Industry. - Robin C. Sarma; Mark D. Dooley; N. Craig Newman; Graham Hetherington (DAC, 1990)

Test Generation and Design for Test for a Large Multiprocessing DSP. - Graham Hetherington; Greg Sutton; Kenneth M. Butler; Theo J. Powell (ITC, 1995)

Logic BIST for large industrial designs: real issues and case studies. - Graham Hetherington; Tony Fryars; Nagesh Tamarapalli; Mark Kassab; Abu S. M. Hassan; Janusz Rajski (ITC, 1999)

Circular BIST testing the digital logic within a high speed Serdes. - Graham Hetherington; Richard Simpson 004 (ITC, 2003)

Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques. - Kenneth M. Butler; Jayashree Saxena; Tony Fryars; Graham Hetherington (ITC, 2004)

A Holistic Parallel and Hierarchical Approach towards Design-For-Test. - C. P. Ravikumar; Graham Hetherington (ITC, 2004)

Testing high-speed, large scale implementation of SerDes I/Os on chips used in throughput computing systems. - Iain Robertson; Graham Hetherington; Tom Leslie; Ishwar Parulkar; Ronald Lesnikoski (ITC, 2005)