Avalanche multiplication and pinch-in models for simulating electrical instability effects in SiGe HBTs. - Grazia Sasso; Maurizio Costagliola; Niccolò Rinaldi (Microelectron. Reliab., 2010)

Ageing and thermal recovery of advanced SiGe heterojunction bipolar transistors under long-term mixed-mode and reverse stress conditions. - Gerhard G. Fischer; Grazia Sasso (Microelectron. Reliab., 2015)

Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit. - Thomas Jacquet; Grazia Sasso; Anjan Chakravorty; Niccolò Rinaldi; Klaus Aufinger; Thomas Zimmer; Vincenzo d'Alessandro; Cristell Maneux (Microelectron. Reliab., 2015)