Novel Techniques for Achieving High At-Speed Transition Fault Test Coverage for Motorola's Microprocessors Based on PowerPC(tm) Instruction Set Architecture. - Nandu Tendolkar; Rajesh Raina; Rick Woltenberg; Xijiang Lin; Bruce Swanson; Greg Aldrich (VTS, 2002)

100 DPPM in Nanometer Technology - Is it achievable? - Greg Aldrich (ITC, 2004)

Mentor Graphics DFT to Navigate Nanometer Test Challenges. - Greg Aldrich; Ron Press; Takeo Kobayashi; Tatsuo Sakajiri (ATS, 2006)

Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis. - Nandu Tendolkar; Dawit Belete; Bill Schwarz; Bob Podnar; Akshay Gupta; Steve Karako; Wu-Tung Cheng; Alex Babin; Kun-Han Tsai; Nagesh Tamarapalli; Greg Aldrich (ITC, 2006)

A RTL Testability Analyzer Based on Logical Virtual Prototyping. - Yu Huang 005; Nilanjan Mukherjee 001; Wu-Tung Cheng; Greg Aldrich (ATS, 2007)