A scalable high-frequency noise model for bipolar transistors with application to optimal transistor sizing for low-noise amplifier design. - Sorin P. Voinigescu; Michael C. Maliepaard; Jonathan L. Showell; Greg E. Babcock; David Marchesan; Michael Schröter; Peter Schvan; David L. Harame (IEEE J. Solid State Circuits, 1997)