Progressive breakdown in ultrathin SiON dielectrics and its effect on transistor performance. - Robert O'Connor; Greg Hughes; Robin Degraeve; Ben Kaczer (Microelectron. Reliab., 2005)

The effect of a post processing thermal anneal on pre-existing and stress induced electrically active defects in ultra-thin SiON dielectric layers. - Robert O'Connor; Greg Hughes (Microelectron. Reliab., 2011)

Reliability of thin ZrO2 gate dielectric layers. - Robert O'Connor; Greg Hughes; Thomas Kauerauf; Lars-Åke Ragnarsson (Microelectron. Reliab., 2011)

Towards Automated Accessibility Report Generation for Mobile Apps. - Amanda Swearngin; Jason Wu 001; Xiaoyi Zhang 006; Esteban Gomez; Jen Coughenour; Rachel Stukenborg; Bhavya Garg; Greg Hughes; Adriana Hilliard; Jeffrey P. Bigham; Jeffrey Nichols 001 (ACM Trans. Comput. Hum. Interact., 2024)