A direct search method for finding the worst performance measure in integrated circuit design. - Gregor Cijan; Tadej Tuma; Árpád Bürmen (ECCTD, 2009)

A Direct Search Method for Worst Case Analysis and Yield Optimization of Integrated Circuits. - Gregor Cijan; Tadej Tuma; Árpád Bürmen (J. Circuits Syst. Comput., 2009)

Direct search approach to integrated circuit sizing for high parametric yield. - Gregor Cijan; Tadej Tuma; Árpád Bürmen (IET Circuits Devices Syst., 2011)