A Commercial Field-Programmable Dense eFUSE Array Memory with 99.999% Sense Yield for 45nm SOI CMOS. - Gregory Uhlmann; Tony Aipperspach; Toshiaki Kirihata; K. Chandrasekharan; Yan Zun Li; Chris Paone; Brian Reed; Norman Robson; John Safran; David Schmitt; Subramanian S. Iyer (ISSCC, 2008)