Fault modeling and test algorithm creation strategy for FinFET-based memories. - Gurgen Harutyunyan; Grigor Tshagharyan; Valery A. Vardanian; Yervant Zorian (VTS, 2014)

Overview study on fault modeling and test methodology development for FinFET-based memories. - Grigor Tshagharyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Yervant Zorian (EWDTS, 2015)

Impact of parameter variations on FinFET faults. - Gurgen Harutyunyan; Grigor Tshagharyan; Yervant Zorian (VTS, 2015)

Securing test infrastructure of system-on-chips. - Grigor Tshagharyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Yervant Zorian (EWDTS, 2016)

Experimental study on Hamming and Hsiao codes in the context of embedded applications. - Grigor Tshagharyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Yervant Zorian (EWDTS, 2017)

An effective functional safety solution for automotive systems-on-chip. - Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian (ITC, 2017)

Implementation of Memory Static, Coupling and Dynamic Fault Models at the Register Transfer Level. - Davit Hayrapetyan; Aleksandr Manukvan; Grigor Tshagharyan (EWDTS, 2018)

Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM. - Sarath Mohanachandran Nair; Rajendra Bishnoi; Mehdi Baradaran Tahoori; Grigor Tshagharyan; Hayk T. Grigoryan; Gurgen Harutyunyan; Yervant Zorian (ITC, 2018)

Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications. - Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian; Anteneh Gebregiorgis; Mohammad Saber Golanbari; Rajendra Bishnoi; Mehdi Baradaran Tahoori (ITC, 2018)

Variation-aware Fault Modeling and Test Generation for STT-MRAM. - Sarath Mohanachandran Nair; Rajendra Bishnoi; Mehdi Baradaran Tahoori; Hayk T. Grigoryan; Grigor Tshagharyan (IOLTS, 2019)

Innovative Practices on In-System Test and Reliability of Memories. - S. Bandyopadhyay; J. Mekkoth; Marc Hutner; Hayk T. Grigoryan; Arun Kumar; Samvel K. Shoukourian; Grigor Tshagharyan; Yervant Zorian; Gabriele Boschi; Duccio Lazzarotti; Donato Luongo; Hanna Shaheen; et al. (VTS, 2019)

An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories. - Mahta Mayahinia; Mehdi B. Tahoori; Gurgen Harutyunyan; Grigor Tshagharyan; Karen Amirkhanyan (ITC, 2022)

Innovative Practices Track: What's Next for Automotive: Where and How to Improve Field Test and Enhance SoC Safety. - Minqiang Peng; Youfa Wu; Jialiang Li; Alex Yu; Grigor Tshagharyan; Costas Argyrides; Vilas Sridharan; Gurgen Harutyunyan; Yervant Zorian; Nilanjan Mukherjee (VTS, 2022)

On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI. - Mahta Mayahinia; Mehdi Baradaran Tahoori; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian (ETS, 2023)

Utilizing ECC Analytics to Improve Memory Lifecycle Management. - Costas Argyrides; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian (ITC, 2023)

SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor. - Kranthi Kandula; Ramalingam Kolisetti; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian (ITC, 2023)

Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era. - Artur Ghukasyan; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian (VTS, 2023)

An Efficient External Memory Test Solution: Case Study for HPC Application. - Keqing Ouyang; Minqiang Peng; Yunnong Zhu; Kang Qi; Grigor Tshagharyan; Arun Kumar; Gurgen Harutyunyan; Isaac Wang (VTS, 2023)

Testing for aging in advanced SRAM: From front end of the line transistors to back end of the line interconnects. - Zhe Zhang; Mahta Mayahinia; Christian Weis; Norbert Wehn; Mehdi B. Tahoori; Sani R. Nassif; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian (ITC, 2024)

Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management. - Zhe Zhang; Mahta Mayahinia; Christian Weis; Norbert Wehn; Mehdi B. Tahoori; Sani R. Nassif; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian (VTS, 2024)

Testing for Electromigration in Sub-5-nm FinFET Memories. - Mahta Mayahinia; Mehdi Baradaran Tahoori; Grigor Tshagharyan; Karen Amirkhanyan; Artur Ghukasyan; Gurgen Harutyunyan; Yervant Zorian (IEEE Des. Test, 2024)

European Test Symposium Teams: an Anniversary Snapshot. - Maksim Jenihhin; Jaan Raik; Artur Jutman; Natalia Cherezova; Raimund Ubar; Liviu Miclea; Szilárd Enyedi; I. Stefan; Ovidiu Stan; Cosmina Corches; Z. Peng; Petru Eles; et al. (ETS, 2025)

Analysis and Mitigation of Radiation Effects in SRAM-based Register Files. - Zhe Zhang; Surendra Hemaram; Mahta Mayahinia; Christian Weis; Norbert Wehn; Mehdi B. Tahoori; Sani Nassif; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian (ETS, 2025)