A critical analysis of sampling-based reconstruction methodology for dielectric breakdown systems (BEOL/MOL/FEOL). - Ernest Y. Wu; James H. Stathis; Baozhen Li; Barry P. Linder; Kai Zhao; Griselda Bonilla (IRPS, 2015)

Time Dependent Dielectric Breakdown of Cobalt and Ruthenium Interconnects at 36nm Pitch. - H. Huang; P. S. McLaughin; James J. Kelly; C.-C. Yang; Richard G. Southwick; M. Wang; Griselda Bonilla; Gauri Karve (IRPS, 2019)

A Flexible and Inherently Self-Consistent Methodology for MOL/BEOL/MIMCAP TDDB Applications with Excessive Variability-Induced Degradation. - Ernest Y. Wu; Ron Bolam; Baozhen Li; Tian Shen; Barry P. Linder; Griselda Bonilla; Miaomiao Wang 006; Dechao Guo (IRPS, 2022)