The regularized blind tip reconstruction algorithm as a scanning probe microscopy tip metrology method - Grzegorz Józwiak; A. Henrykowski; A. Masalska; Teodor P. Gotszalk; I. Ritz; H. Steigmann (CoRR, 2011)

Standard and self-sustained magnetron sputtering deposited Cu films investigated by means of AFM and XRD. - Artur Wiatrowski; W. M. Posadowski; Grzegorz Józwiak; Jaroslaw Serafinczuk; R. F. Szeloch; Teodor P. Gotszalk (Microelectron. Reliab., 2011)

Characterization of fatigued Al lines by means of SThM and XRD: Analysis using fast Fourier transform. - R. F. Szeloch; Pawel Janus; Jaroslaw Serafinczuk; P. M. Szecówka; Grzegorz Józwiak (Microelectron. Reliab., 2012)