MIAC: A mobility intention auto-completion model for location prediction. - Feng Yi; Guan Feng; Hongtao Wang 002; Zhi Li 018; Limin Sun 001 (Intell. Syst. Account. Finance Manag., 2018)

Comprehensive Analysis of Duty-Cycle Induced Degradations in HfxZr1-xO2-Based Ferroelectric Capacitors: Behavior, Modeling, and Optimization. - Guan Feng; Yu Li; Hao Jiang; Xiaodong Wang; Yize Sun; Yingfen Wei; Qi Liu; Ming Liu (VLSI Technology and Circuits, 2024)