High-Precision Error Bit Prediction for 3D QLC NAND Flash Memory: Observations, Analysis, and Modeling. - Guangkuo Yang; Meng Zhang 014; Peng Guo; Xuepeng Zhan; Shaoqi Yang; Xiaohuan Zhao; Xinyi Guo; Pengpeng Sang; Jixuan Wu; Fei Wu 005; Jiezhi Chen (IEEE Trans. Computers, 2025)

Retention Accelerated Testing for 3-D QLC nand Flash Memory: Characterization, Analysis, and Modeling. - Shaoqi Yang; Meng Zhang 014; Xuepeng Zhan; Peng Guo; Xiaohuan Zhao; Guangkuo Yang; Xinyi Guo; Jixuan Wu; Fei Wu 005; Jiezhi Chen (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2025)