Burnout properties of microwave pulse injected on GaAs PHEMT. - Cunbo Zhang; Jian-de Zhang; Honggang Wang 003; Guangxing Du (Microelectron. Reliab., 2015)

Damage effects on low noise amplifiers with microwave pulses. - Cunbo Zhang; Jian-de Zhang; Honggang Wang 003; Guangxing Du (Microelectron. Reliab., 2016)

D-MSCD: Mean-Standard Deviation Curve Descriptor Based on Deep Learning. - Zhanqiang Huo; Guangxing Du; Fen Luo; Yingxu Qiao; Junwei Luo (IEEE Access, 2020)

Analytical Dual-Band Matching Approach for Concurrent High-Efficiency Power Amplifiers. - Wang Liu; Qiang Liu 017; Guangxing Du; Guolin Li (IEEE Trans. Circuits Syst. II Express Briefs, 2022)