Overshoot stress impact on HfO2 high-κ layer dynamic SILC. - Guangxing Wan; Tianli Duan; Shuxiang Zhang; Lingli Jiang; Bo Tang; Chao Zhao 004; Huilong Zhu; Hongyu Yu (ASICON, 2015)

Charge pumping test technique using CMOS ring oscillator on leakage issue. - Yongbo Liu; Zhengyong Zhu; Huilong Zhu; Guangxing Wan; Junfeng Li; Chao Zhao (Microelectron. J., 2017)