Physics of failure-based failure mode, effects, and criticality analysis for Integrated Circuits. - Wenhao Qiu; Guangyao Lian; Mingxi Xue; Kaoli Huang (Syst. Eng., 2018)

Test sample allocation method for testability verification test. - Wenhao Qiu; Guangyao Lian; Peng Zhou; Kaoli Huang (Qual. Reliab. Eng. Int., 2020)

Research on Electronic Circuit Fault Diagnosis Method Based on SWT and DCNN-ELM. - Yu Zhang; Zhonghua Cheng; Zhenghao Wu; Enzhi Dong; Runze Zhao; Guangyao Lian (IEEE Access, 2023)