Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything? - Will R. Moore; Guido Gronthoud; Keith Baker; Maurice Lousberg (ITC, 2000)

Reducing analogue fault-simulation time by using high-level modelling in dotss for an industrial design. - Liquan Fang; Guido Gronthoud; Hans G. Kerkhoff (ETW, 2001)

Process-variability aware delay fault testing of ΔVT and weak-open defects. - Daniel Arumí-Delgado; Rosa Rodríguez-Montañés; José Pineda de Gyvez; Guido Gronthoud (ETW, 2003)

VDD Ramp Testing for RF Circuits. - José Pineda de Gyvez; Guido Gronthoud; Rashid Amine (ITC, 2003)

Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model. - Ananta K. Majhi; Guido Gronthoud; Camelia Hora; Maurice Lousberg; Pop Valer; Stefan Eichenberger (VTS, 2003)

Power Supply Ramping for Quasi-static Testing of PLLs. - José Pineda de Gyvez; Guido Gronthoud; Cristiano Cenci; Martin Posch; Thomas Burger; Manfred Koller (ITC, 2004)

On Hazard-free Patterns for Fine-delay Fault Testing. - Bram Kruseman; Ananta K. Majhi; Guido Gronthoud; Stefan Eichenberger (ITC, 2004)

Memory Testing Under Different Stress Conditions: An Industrial Evaluation. - Ananta K. Majhi; Mohamed Azimane; Guido Gronthoud; Maurice Lousberg; Stefan Eichenberger; Fred Bowen (DATE, 2005)

Memory testing improvements through different stress conditions. - Ananta K. Majhi; Mohamed Azimane; Guido Gronthoud; Maurice Lousberg; Stefan Eichenberger; Fred Bowen (ESSCIRC, 2005)

Stuck-open fault diagnosis with stuck-at model. - Xinyue Fan; Will R. Moore; Camelia Hora; Guido Gronthoud (ETS, 2005)

A novel stuck-at based method for transistor stuck-open fault diagnosis. - Xinyue Fan; Will R. Moore; Camelia Hora; Guido Gronthoud (ITC, 2005)

Functional vs. multi-VDD testing of RF circuits. - Estella Silva; José Pineda de Gyvez; Guido Gronthoud (ITC, 2005)

A New Algorithm for Dynamic Faults Detection in RAMs. - Mohamed Azimane; Ananta K. Majhi; Guido Gronthoud; Maurice Lousberg (VTS, 2005)

Multi-VDD Testing for Analog Circuits. - José Pineda de Gyvez; Guido Gronthoud; Rashid Amine (J. Electron. Test., 2005)

Power Supply Noise in Delay Testing. - Jing Wang 006; D. M. H. Walker; Ananta K. Majhi; Bram Kruseman; Guido Gronthoud; Luis Elvira Villagra; Paul van de Wiel; Stefan Eichenberger (ITC, 2006)

A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis. - Xinyue Fan; Will R. Moore; Camelia Hora; Mario Konijnenburg; Guido Gronthoud (VTS, 2006)

Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated Circuits. - Amir Zjajo; José Pineda de Gyvez; Guido Gronthoud (J. Electron. Test., 2006)

Re-configuration of sub-blocks for effective application of time domain tests. - Jens Anders; Shaji Krishnan; Guido Gronthoud (DATE, 2007)

On Performance Testing with Path Delay Patterns. - Bram Kruseman; Ananta K. Majhi; Guido Gronthoud (VTS, 2007)

Modeling Power Supply Noise in Delay Testing. - Jing Wang 006; Duncan M. Hank Walker; Xiang Lu; Ananta K. Majhi; Bram Kruseman; Guido Gronthoud; Luis Elvira Villagra; Paul J. A. M. van de Wiel; Stefan Eichenberger (IEEE Des. Test Comput., 2007)

Extending gate-level diagnosis tools to CMOS intra-gate faults. - Xinyue Fan; Will R. Moore; Camelia Hora; Guido Gronthoud (IET Comput. Digit. Tech., 2007)

Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design. - Vladimir A. Zivkovic; Frank van der Heyden; Guido Gronthoud; Frans G. M. de Jong (ETS, 2008)

Algorithms for ADC Multi-site Test with Digital Input Stimulus. - Xiaoqin Sheng; Hans G. Kerkhoff; Amir Zjajo; Guido Gronthoud (ETS, 2009)

ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus. - Xiaoqin Sheng; Hans G. Kerkhoff; Amir Zjajo; Guido Gronthoud (J. Electron. Test., 2012)