Process Diagnosis via Electrical-Wafer-Sorting Maps Classification. - Federico Di Palma; Giuseppe De Nicolao; Guido Miraglia; Oliver M. Donzelli (ICDM, 2005)

Unsupervised spatial pattern classification of electrical-wafer-sorting maps in semiconductor manufacturing. - Federico Di Palma; Giuseppe De Nicolao; Guido Miraglia; Egidio Pasquinetti; Francesco Piccinini (Pattern Recognit. Lett., 2005)

ACID: Automatic Sort-Map Classification for Interactive Process Diagnosis. - Federico Di Palma; Giuseppe De Nicolao; Guido Miraglia; Oliver M. Donzelli (IEEE Des. Test Comput., 2007)