RF CMOS reliability simulations. - Guido T. Sasse; Mustafa Acar; Fred G. Kuper; Jurriaan Schmitz (Microelectron. Reliab., 2008)

The temperature dependence of mixed mode degradation in bipolar transistors. - Guido T. Sasse; Martin Combrié (Microelectron. Reliab., 2012)

Hot carrier induced TDDB in HV MOS: Lifetime model and extrapolation to use conditions. - Guido T. Sasse (IRPS, 2018)

Aging models for n- and p-type LDMOS covering low, medium and high VGS operation. - Guido T. Sasse; Vignesh Subramanian; Ljubo Radic (IRPS, 2021)

Drain-side TDDB for RF applications. - Guido T. Sasse; Dieter Lipp (IRPS, 2025)