Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below). - Guillaume Celi; Sylvain Dudit; Philippe Perdu; Antoine Reverdy; Thierry Parrassin; Emmanuel Bechet; Dean Lewis; Michel Vallet (Microelectron. Reliab., 2010)

Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis. - Guillaume Bascoul; Philippe Perdu; A. Benigni; Sylvain Dudit; Guillaume Celi; Dean Lewis (Microelectron. Reliab., 2011)

LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis. - Guillaume Celi; Sylvain Dudit; Thierry Parrassin; Philippe Perdu; Antoine Reverdy; Dean Lewis; Michel Vallet (Microelectron. Reliab., 2011)

Failure analysis defect location on a real case 55 nm memory using dynamic power supply emulation. - Thierry Parrassin; Guillaume Celi; Sylvain Dudit; Michel Vallet (Microelectron. Reliab., 2011)