Characterization and modeling of charge trapping: From single defects to devices. - Tibor Grasser; Gerhard Rzepa; Michael Waltl; Wolfgang Goes; Karina Rott; Gunnar Andreas Rott; Hans Reisinger; Jacopo Franco; Ben Kaczer (ICICDT, 2014)

Mixture of negative bias temperature instability and hot-carrier driven threshold voltage degradation of 130 nm technology p-channel transistors. - Gunnar Andreas Rott; Karina Rott; Hans Reisinger; Wolfgang Gustin; Tibor Grasser (Microelectron. Reliab., 2014)

NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification. - Christian Schlünder; Katja Puschkarsky; Gunnar Andreas Rott; Wolfgang Gustin; Hans Reisinger (Microelectron. Reliab., 2018)