High-Dimensional Yield Estimation Using Shrinkage Deep Features and Maximization of Integral Entropy Reduction. - Shuo Yin; Guohao Dai 002; Wei W. Xing (ASP-DAC, 2023)

Seeking the Yield Barrier: High-Dimensional SRAM Evaluation Through Optimal Manifold. - Yanfang Liu; Guohao Dai 002; Wei W. Xing (DAC, 2023)

OPT: Optimal Proposal Transfer for Efficient Yield Optimization for Analog and SRAM Circuits. - Yanfang Liu; Guohao Dai 002; Yuanqing Cheng; Wang Kang 001; Wei W. Xing (ICCAD, 2023)