Degradation Mechanisms of Gate Leakage in GaN-Based HEMTs at Low Dose Rate Irradiation. - Xiaolong Li; Xin Wang 141; Mohan Liu; Kunfeng Zhu; Guohua Shui; Qiwen Zheng; Jiangwei Cui; Wu Lu; Yudong Li; Qi Guo 007 (IEEE Access, 2024)