Applying the fWLR concept to Stress induced leakage current in non-volatile memory processes. - Guoqiao Tao; Andrea Scarpa; Leo van Marwijk; Kitty van Dijk; Fred G. Kuper (Microelectron. Reliab., 2004)

Experimental study of carrier transport in multi-layered structures. - Guoqiao Tao; Cedric Ouvrard; Helene Chauveau; Som Nath (Microelectron. Reliab., 2007)