Minimal March Tests for Unlinked Static Faults in Random Access Memories. - Gurgen Harutunyan; Valery A. Vardanian; Yervant Zorian (VTS, 2005)

Minimal March-Based Fault Location Algorithm with Partial Diagnosis for all Static Faults in Random Access Memories. - Gurgen Harutunyan; Valery A. Vardanian; Yervant Zorian (DDECS, 2006)

Minimal March Tests for Dynamic Faults in Random Access Memories. - Gurgen Harutunyan; Valery A. Vardanian; Yervant Zorian (ETS, 2006)

A March-Based Algorithm for Location and Full Diagnosis of All Unlinked Static Faults. - T. A. Gyonjyan; Gurgen Harutunyan; Valery A. Vardanian (MTDT, 2006)

Minimal March Test Algorithm for Detection of Linked Static Faults in Random Access Memories. - Gurgen Harutunyan; Valery A. Vardanian; Yervant Zorian (VTS, 2006)

A March-based Fault Location Algorithm with Partial and Full Diagnosis for All Simple Static Faults in Random Access Memories. - Gurgen Harutunyan; Valery A. Vardanian; Yervant Zorian (DDECS, 2007)

Minimal March Tests for Detection of Dynamic Faults in Random Access Memories. - Gurgen Harutunyan; Valery A. Vardanian; Yervant Zorian (J. Electron. Test., 2007)

An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories. - Gurgen Harutunyan; Valery A. Vardanian; Yervant Zorian (VTS, 2008)

An efficient March test for detection of all two-operation dynamic faults from subclass Sav. - H. Avetisyan; Gurgen Harutyunyan; Valery A. Vardanian; Yervant Zorian (EWDTS, 2010)

A Robust Solution for Embedded Memory Test and Repair. - K. Darbinyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (Asian Test Symposium, 2011)

Generic BIST architecture for testing of content addressable memories. - Hayk T. Grigoryan; Gurgen Harutunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (IOLTS, 2011)

Symmetry Measure for Memory Test and Its Application in BIST Optimization. - Gurgen Harutunyan; Aram Hakhumyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (J. Electron. Test., 2011)

A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs. - Gurgen Harutyunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Application of defect injection flow for fault validation in memories. - K. Amirkhanyan; A. Davtyan; Gurgen Harutyunyan; T. Melkumyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (EWDTS, 2013)

Impact of process variations on read failures in SRAMs. - Gurgen Harutyunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (EWDTS, 2013)

An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters. - T. Melkumyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (EWDTS, 2013)

Integrating embedded test infrastructure in SRAM cores to detect aging. - W. Prates; Letícia Maria Veiras Bolzani; Gurgen Harutyunyan; A. Davtyan; Fabian Vargas 001; Yervant Zorian (IOLTS, 2013)

An effective solution for building memory BIST infrastructure based on fault periodicity. - Gurgen Harutyunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (VTS, 2013)

Extending fault periodicity table for testing faults in memories under 20nm. - Gurgen Harutyunyan; Samvel K. Shoukourian; Valery A. Vardanian; Yervant Zorian (EWDTS, 2014)

Fault modeling and test algorithm creation strategy for FinFET-based memories. - Gurgen Harutyunyan; Grigor Tshagharyan; Valery A. Vardanian; Yervant Zorian (VTS, 2014)

A power based memory BIST grouping methodology. - L. Martirosyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Yervant Zorian (EWDTS, 2015)

Overview study on fault modeling and test methodology development for FinFET-based memories. - Grigor Tshagharyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Yervant Zorian (EWDTS, 2015)

An effective embedded test & diagnosis solution for external memories. - Gurgen Harutunyan; Yervant Zorian (IOLTS, 2015)

Impact of parameter variations on FinFET faults. - Gurgen Harutyunyan; Grigor Tshagharyan; Yervant Zorian (VTS, 2015)

Extending fault periodicity table for testing external memory faults. - Gurgen Harutyunyan (EWDTS, 2016)

Securing test infrastructure of system-on-chips. - Grigor Tshagharyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Yervant Zorian (EWDTS, 2016)

An efficient testing methodology for embedded flash memories. - Suren Martirosyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Yervant Zorian (EWDTS, 2017)

Automated flow for test pattern creation for IPs in SoC. - D. Sargsyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Yervant Zorian (EWDTS, 2017)

Experimental study on Hamming and Hsiao codes in the context of embedded applications. - Grigor Tshagharyan; Gurgen Harutyunyan; Samvel K. Shoukourian; Yervant Zorian (EWDTS, 2017)

Advanced ECC solution for automotive SoCs. - Hanna Shaheen; Gabriele Boschi; Gurgen Harutyunyan; Yervant Zorian (IOLTS, 2017)

Advanced functional safety mechanisms for embedded memories and IPs in automotive SoCs. - Tal Kogan; Yehonatan Abotbol; Gabriele Boschi; Gurgen Harutyunyan; I. Kroul; Hanna Shaheen; Yervant Zorian (ITC, 2017)

An effective functional safety solution for automotive systems-on-chip. - Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian (ITC, 2017)

Case Study and Advanced Functional Safety Solution for Automotive SoCs. - M. Casarsa; Gurgen Harutyunyan (ITC, 2018)

Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs. - Hayk T. Grigoryan; Samvel K. Shoukourian; Gurgen Harutyunyan; Yervant Zorian; Costas Argyrides (ITC, 2018)

Advanced Uniformed Test Approach For Automotive SoCs. - Tal Kogan; Yehonatan Abotbol; Gabriele Boschi; Gurgen Harutyunyan; N. Martirosyan; Yervant Zorian (ITC, 2018)

Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM. - Sarath Mohanachandran Nair; Rajendra Bishnoi; Mehdi Baradaran Tahoori; Grigor Tshagharyan; Hayk T. Grigoryan; Gurgen Harutyunyan; Yervant Zorian (ITC, 2018)

Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications. - Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian; Anteneh Gebregiorgis; Mohammad Saber Golanbari; Rajendra Bishnoi; Mehdi Baradaran Tahoori (ITC, 2018)

Innovative practices on memory test practice. - M. Casarsa; Gurgen Harutyunyan; Kaitlyn Chen; Ramesh Sharma; Giri Podichetty; Martin Keim; Sreejit Chakravarty; Ramesh C. Tekumalla (VTS, 2018)

Memory FIT Rate Mitigation Technique for Automotive SoCs. - Gabriele Boschi; Donato Luongo; Duccio Lazzarotti; Hanna Shaheen; Hayk T. Grigoryan; Gurgen Harutyunyan; Samvel K. Shoukourian; Yervant Zorian (ITC, 2019)

Innovative Practices on In-System Test and Reliability of Memories. - S. Bandyopadhyay; J. Mekkoth; Marc Hutner; Hayk T. Grigoryan; Arun Kumar; Samvel K. Shoukourian; Grigor Tshagharyan; Yervant Zorian; Gabriele Boschi; Duccio Lazzarotti; Donato Luongo; Hanna Shaheen; et al. (VTS, 2019)

Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism. - Gurgen Harutyunyan; Samvel K. Shoukourian; Yervant Zorian (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019)

Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications. - Gabriele Boschi; Elisa Spano; Hayk T. Grigoryan; Arun Kumar; Gurgen Harutyunyan (ITC, 2020)

Test and Diagnosis Solution for Functional Safety. - M. Casarsa; Gurgen Harutyunyan; Yervant Zorian (ITC, 2020)

Memory Physical Aware Multi-Level Fault Diagnosis Flow. - Gurgen Harutyunyan; Suren Martirosyan; Samvel K. Shoukourian; Yervant Zorian (IEEE Trans. Emerg. Top. Comput., 2020)

A Novel Protection Technique for Embedded Memories with Optimized PPA. - Costas Argyrides; Vilas Sridharan; Hayk Danoyan; Gurgen Harutyunyan; Yervant Zorian (ITC, 2022)

An Efficient Test Strategy for Detection of Electromigration Impact in Advanced FinFET Memories. - Mahta Mayahinia; Mehdi B. Tahoori; Gurgen Harutyunyan; Grigor Tshagharyan; Karen Amirkhanyan (ITC, 2022)

Innovative Practices Track: What's Next for Automotive: Where and How to Improve Field Test and Enhance SoC Safety. - Minqiang Peng; Youfa Wu; Jialiang Li; Alex Yu; Grigor Tshagharyan; Costas Argyrides; Vilas Sridharan; Gurgen Harutyunyan; Yervant Zorian; Nilanjan Mukherjee (VTS, 2022)

On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI. - Mahta Mayahinia; Mehdi Baradaran Tahoori; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian (ETS, 2023)

Utilizing ECC Analytics to Improve Memory Lifecycle Management. - Costas Argyrides; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian (ITC, 2023)

SLM Subsystem for Automotive SoC: Case Study on Path Margin Monitor. - Kranthi Kandula; Ramalingam Kolisetti; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian (ITC, 2023)

Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era. - Artur Ghukasyan; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian (VTS, 2023)

An Efficient External Memory Test Solution: Case Study for HPC Application. - Keqing Ouyang; Minqiang Peng; Yunnong Zhu; Kang Qi; Grigor Tshagharyan; Arun Kumar; Gurgen Harutyunyan; Isaac Wang (VTS, 2023)

On-Chip Sensor to Monitor Aging Evolution in FinFET-Based Memories. - Fabian Vargas 001; Vache Galstyan; Gurgen Harutyunyan; Yervant Zorian (IOLTS, 2024)

Testing for aging in advanced SRAM: From front end of the line transistors to back end of the line interconnects. - Zhe Zhang; Mahta Mayahinia; Christian Weis; Norbert Wehn; Mehdi B. Tahoori; Sani R. Nassif; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian (ITC, 2024)

Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management. - Zhe Zhang; Mahta Mayahinia; Christian Weis; Norbert Wehn; Mehdi B. Tahoori; Sani R. Nassif; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian (VTS, 2024)

Testing for Electromigration in Sub-5-nm FinFET Memories. - Mahta Mayahinia; Mehdi Baradaran Tahoori; Grigor Tshagharyan; Karen Amirkhanyan; Artur Ghukasyan; Gurgen Harutyunyan; Yervant Zorian (IEEE Des. Test, 2024)

European Test Symposium Teams: an Anniversary Snapshot. - Maksim Jenihhin; Jaan Raik; Artur Jutman; Natalia Cherezova; Raimund Ubar; Liviu Miclea; Szilárd Enyedi; I. Stefan; Ovidiu Stan; Cosmina Corches; Z. Peng; Petru Eles; et al. (ETS, 2025)

Analysis and Mitigation of Radiation Effects in SRAM-based Register Files. - Zhe Zhang; Surendra Hemaram; Mahta Mayahinia; Christian Weis; Norbert Wehn; Mehdi B. Tahoori; Sani R. Nassif; Grigor Tshagharyan; Gurgen Harutyunyan; Yervant Zorian (ETS, 2025)