A STAFAN-like functional testability measure for register-level circuits. - C. P. Ravikumar; Gurjeet S. Saund; Nidhi Agrawal (Asian Test Symposium, 1995)

Partial Scan beyond Cycle Cutting. - Gurjeet S. Saund; Michael S. Hsiao; Janak H. Patel (FTCS, 1997)

Partial Scan Selection Based on Dynamic Reachability and Observability Information. - Michael S. Hsiao; Gurjeet S. Saund; Elizabeth M. Rudnick; Janak H. Patel (VLSI Design, 1998)

A functional-level testability measure for register-level circuits and its estimation. - C. P. Ravikumar; Gurjeet S. Saund; Nidhi Agrawal (Microprocess. Microsystems, 1999)