PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques. - Katherine Shu-Min Li; Peter Yi-Yu Liao; Leon Chou; Ken Chau-Cheung Cheng; Andrew Yi-Ann Huang; Sying-Jyan Wang; Gus Chang-Hung Han (ETS, 2020)

Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering. - Katherine Shu-Min Li; Leon Li-Yang Chen; Ken Chau-Cheung Cheng; Peter Yi-Yu Liao; Sying-Jyan Wang; Andrew Yi-Ann Huang; Nova Cheng-Yen Tsai; Leon Chou; Gus Chang-Hung Han; Jwu E. Chen; Hsing-Chung Liang; Chun-Lung Hsu (ETS, 2021)