Thermal transient characterization of semiconductor devices with multiple heat sources - Fundamentals for a new thermal standard. - Dirk Schweitzer; Ferenc Ender; Gusztáv Hantos; Péter G. Szabó (Microelectron. J., 2015)

An efficient reliability testing method combined with thermal performance monitoring. - Gusztáv Hantos; Jozsef Hegedus; Márta Rencz (Microelectron. Reliab., 2017)

Light output stabilisation of LED based streetlighting luminaires by adaptive current control. - Jozsef Hegedus; Gusztáv Hantos; András Poppe (Microelectron. Reliab., 2017)