Revisiting DDIM Inversion for Controlling Defect Generation by Disentangling the Background. - Youngjae Cho; Gwangyeol Kim; Sirojbek Safarov; Seongdeok Bang; Jaewoo Park (CoRR, 2024)

SSIM-Based Autoencoder Modeling to Defeat Adversarial Patch Attacks. - Seungyeol Lee; Seongwoo Hong; Gwangyeol Kim; Jaecheol Ha (Sensors, 2024)