Deep learning-based defective product classification system for smart factory. - Huy Toan Nguyen; Nu-ri Shin; Gwanghyun Yu; Gyeong-Ju Kwon; Woo-Young Kwak; Jin-Young Kim 002 (SMA, 2020)

Multi-Camera-Based Sorting System for Surface Defects of Apples. - Ju-Hwan Lee; Hoang-Trong Vo; Gyeong-Ju Kwon; Hyoung-Gook Kim; Jin-Young Kim 002 (Sensors, 2023)