Impact of Displacement Defect Owing to Cosmic Rays on Three-Nanometer-Node Nanosheet FET 6T Static Random Access Memory. - Jonghyeon Ha; Minji Bang; Gyeongyeop Lee; Minki Suh; Chong-Eun Kim; Jungsik Kim (IEEE Access, 2023)

Prediction of Statistical Distribution on Nanosheet FET by Geometrical Variability Using Various Machine Learning Models. - Jonghyeon Ha; Sun-Jin Kim; Minji Bang; Gyeongyeop Lee; Minki Suh; Minseob Shim; Chong-Eun Kim; Jungsik Kim (IEEE Access, 2023)

Overhang Saddle Fin Sidewall Structure for Highly Reliable DRAM Operation. - Jin-Woo Han; Minki Suh; Gyeongyeop Lee; Jungsik Kim (IEEE Access, 2023)

Investigation Into the Degradation of DDR4 DRAM Owing to Total Ionizing Dose Effects. - Gyeongyeop Lee; Minki Suh; Minsang Ryu; Yunjong Lee; Jin-Woo Han; Jungsik Kim (IEEE Access, 2023)