Mixed particle Monte Carlo method for deep submicron semiconductor device simulator. - Gyo-Young Jin; Young-June Park; Hong-Shick Min (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1991)

A 31 ns Random Cycle VCAT-Based 4F 2 DRAM With Manufacturability and Enhanced Cell Efficiency. - Ki-Whan Song; Jinyoung Kim; Jae-Man Yoon; Sua Kim; Huijung Kim; Hyun-Woo Chung; Hyungi Kim; Kanguk Kim; Hwan-Wook Park; Hyun Chul Kang; Nam-Kyun Tak; Dukha Park; et al. (IEEE J. Solid State Circuits, 2010)

Novel Deep Trench Buried-Body-Contact (DBBC) of 4F2 cell for sub 30nm DRAM technology. - Youngseung Cho; Yoosang Hwang; Huijung Kim; Eunok Lee; Soojin Hong; Hyun-Woo Chung; Daeik Kim; Jinyoung Kim; Yong Chul Oh; Hyeongsun Hong; Gyo-Young Jin; Chilhee Chung (ESSDERC, 2012)

The classification methodology of chip quality using canonical correlation analysis-based variable selection on chip level data. - Ki-Hyun Kim; Hyung-Shin Kwon; Hee-Il Hong; Hong-Sun Hwang; Kang-Yong Cho; Gyo-Young Jin (IEEM, 2015)

A 6.4Gb/s/pin at sub-1V supply voltage TX-interleaving technique for mobile DRAM interface. - Chang-Kyo Lee; Min-Su Ahn; Daesik Moon; Kiho Kim; Yoon-Joo Eom; Won-Young Lee; Jongmin Kim; Sanghyuk Yoon; Baekkyu Choi; Seokhong Kwon; Joon-Young Park; Seung-Jun Bae; et al. (VLSIC, 2015)

Design of non-contact 2Gb/s I/O test methods for high bandwidth memory (HBM). - Hyunui Lee; Sukyong Kang; Hye-Seung Yu; Won-Joo Yun; Jae-Hun Jung; Sungoh Ahn; Wang-Soo Kim; Beomyong Kil; Yoo-Chang Sung; Sang-Hoon Shin; Yong-Sik Park; Yong-Hwan Kim; et al. (A-SSCC, 2016)

18.1 A 20nm 9Gb/s/pin 8Gb GDDR5 DRAM with an NBTI monitor, jitter reduction techniques and improved power distribution. - Hye-Yoon Joo; Seung-Jun Bae; Young-Soo Sohn; Young-Sik Kim; Kyung-Soo Ha; Min-Su Ahn; Young-Ju Kim 001; Yong-Jun Kim; Ju-Hwan Kim; Won-Jun Choi; Chang-Ho Shin; Soo Hwan Kim; et al. (ISSCC, 2016)

18.2 A 1.2V 20nm 307GB/s HBM DRAM with at-speed wafer-level I/O test scheme and adaptive refresh considering temperature distribution. - Kyomin Sohn; Won-Joo Yun; Reum Oh; Chi-Sung Oh; Seong-Young Seo; Min-Sang Park; Dong-Hak Shin; Won-Chang Jung; Sang-Hoon Shin; Je-Min Ryu; Hye-Seung Yu; Jae-Hun Jung; et al. (ISSCC, 2016)

Defect Analysis and Cost-Effective Resilience Architecture for Future DRAM Devices. - Sang-uhn Cha; Seongil O; Hyunsung Shin; Sangjoon Hwang; Kwang-Il Park; Seong-Jin Jang; Joo-Sun Choi; Gyo-Young Jin; Young Hoon Son; Hyunyoon Cho; Jung Ho Ahn; Nam Sung Kim (HPCA, 2017)

23.4 An extremely low-standby-power 3.733Gb/s/pin 2Gb LPDDR4 SDRAM for wearable devices. - Hye-Jung Kwon; Eunsung Seo; ChangYong Lee; Young-Hun Seo; Gong-Heum Han; Hye-Ran Kim; Jong-Ho Lee; Min-Su Jang; Sung-Geun Do; Seung-Hyun Cho; Jae-Koo Park; Su-Yeon Doo; et al. (ISSCC, 2017)

23.2 A 5Gb/s/pin 8Gb LPDDR4X SDRAM with power-isolated LVSTL and split-die architecture with 2-die ZQ calibration scheme. - Chang-Kyo Lee; Yoon-Joo Eom; Jin-Hee Park; Junha Lee; Hye-Ran Kim; Kihan Kim; Young Choi; Ho-Jun Chang; Jonghyuk Kim; Jong-Min Bang; Seungjun Shin; Hanna Park; et al. (ISSCC, 2017)

A 1.2 V 20 nm 307 GB/s HBM DRAM With At-Speed Wafer-Level IO Test Scheme and Adaptive Refresh Considering Temperature Distribution. - Kyomin Sohn; Won-Joo Yun; Reum Oh; Chi-Sung Oh; Seong-Young Seo; Min-Sang Park; Dong-Hak Shin; Won-Chang Jung; Sang-Hoon Shin; Je-Min Ryu; Hye-Seung Yu; Jae-Hun Jung; et al. (IEEE J. Solid State Circuits, 2017)

A 16-Gb, 18-Gb/s/pin GDDR6 DRAM With Per-Bit Trainable Single-Ended DFE and PLL-Less Clocking. - Young-Ju Kim 001; Hye-Jung Kwon; Su-Yeon Doo; Min-Su Ahn; Yong-Hun Kim; Yong Jae Lee; Dong-Seok Kang; Sung-Geun Do; Chang-Yong Lee; Gun-hee Cho; Jae-Koo Park; Jae-Sung Kim; et al. (IEEE J. Solid State Circuits, 2019)