Observation of Anomalous Negative Differential Resistance in Diode Breakdown Simulation Using Carrier Temperature Dependent Impact Ionization. - Edwin C. Kan; Gyoyoung Jin; Zhiping Yu; Robert W. Dutton (VLSI Design, 1998)

Off-state degradation with ac bias in PMOSFET. - Segeun Park; Hyuckchai Jung; Jeonghoon Oh; Ilgweon Kim; Hyoungsun Hong; Gyoyoung Jin; Yonghan Roh (Microelectron. Reliab., 2016)

The improvement of HEIP immunity using STI engineering at DRAM. - Seung Uk Han; Youngyoun Lee; Yongdoo Kim; Jemin Park; Junhee Lim; Satoru Yamada; Hyeongsun Hong; Kyupil Lee; Gyoyoung Jin; Eunseung Jung (Microelectron. Reliab., 2017)